M48Z35-70PC1

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    Especificaciones

    Fabricante: STMicroelectronics

    Device Type: Integrated zero-power non-volatile SRAM (NVSRAM) with built-in lithium backup cell, through-hole packaged parallel memory device

    Especificaciones eléctricas

    Total storage capacity: 256 Kbit, arranged as 32K × 8-bit

    Parallel bus interface, 8-bit data width

    Access time: 70 nanoseconds

    Operating supply voltage range: 4.75 V to 5.5 V, standard 5V powered design

    Typical active operating current: 50 mA

    Operating ambient temperature range: 0 °C to 70 °C

    Package type: 28-pin PCDIP through-hole dual in-line package

    Packaging form: plastic tube bulk packaging

    Built-in internal lithium primary battery for data backup

    Core Functional Features

    This component adopts the proprietary ZeroPower memory architecture. Standard SRAM reading and writing logic is applied during normal system power supply, with no restrictions on write operation cycles and no dedicated programming timing required unlike EEPROM or flash memory.

    Integrated power failure detection circuit and battery management logic on a single chip. Once external main power is cut off automatically, the internal lithium battery supplies tiny standby current to the SRAM array to retain all stored data steadily.

    Pin definition and electrical timing are fully compatible with JEDEC standard 32K×8 parallel SRAM. It can be directly plugged into SRAM, ROM and EPROM standard sockets without modifying main circuit hardware design.

    The sealed package structure protects the built-in lithium cell, supporting a minimum of 10 years of continuous data retention under normal working environment.

    All pins are equipped with internal surge and electrostatic protection circuits to adapt to industrial control equipment power fluctuation interference.

    Compliant with RoHS environmental requirements, lead-free terminal plating.

    Escenarios típicos de aplicación

    Industrial PLC running parameters and fault log storage

    Automated testing equipment calibration data and running record preservation

    Medical embedded equipment configuration parameter backup

    Communication base station auxiliary running data storage

    Instrument panel cumulative data and system setting recording

    Industrial monitoring terminal real-time cache data non-volatile storage